SEMI International Standards Meetings
Day 2
Wednesday, November 11 | 9:00 am - 4:30 pm
ICM (Internationales Congress Center München)
Meetings:
| Int'l Advanced Surface Inspection (TF) | 9:00 am - 10:00 am | ICM | |
| Int'l Test Methods (TF) | 10:00 am - 11:00 am | ICM | |
| Int'l Polished Wafer (TF) | 11:00 am - 12:00 pm | ICM | |
| Silicon Wafer GCS | 12:00 pm - 1:00 pm | ICM | |
| Int' Advanced Wafer Geometry (TF) | 1:00 pm - 3:00 pm | ICM | |
| Gases and Liquid Chemicals (TC) | 3:30 pm - 4:30 pm | ICM |
*Please note that the times and agenda are subject to change.
Note:
- You must be a SEMI Standards Program Member to participate in the meetings. Membership is FREE!
- Complete the Application Form today to become a Standards Member.
For any questions, please contact Kevin Nguyen, International Standards Operations Manager.