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12th European Manufacturing Test Conference (EMTC)
Date: 20-21 October, Messe Dresden
Room: t.b.d.
Mapping Digital Test and Diagnosis Approaches on the Emerging Integrated Analog Mixed Signal Arena
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Sponsored by:
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The 12th European Manufacturing Test Conference (EMTC) provides a practical focus on real solutions in the production test environment. The presentations will describe practical and successful solutions from the test arena, taking into account Europe's strength and opportunities, this year with an emphasis on the AMS (Analog Mixed Signal) and the RF area.
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Wednesday 20 October 2010
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SESSION 1: Adaptive Test Experiences and Its Future
Session-chair: Chris Portelli-Hale, STMicroelectronics
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14:00
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Welcome and Opening Remarks, Rene Segers
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14:15
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“Lessons Learned in Deploying Part Average Testing in a Production Environment”
Kieran Horgan, Sr. Projects Engineer, Analog Devices / Philippe Lejeune, CTO, Galaxy Semiconductor Solutions
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14:40
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“Efficiency Improvements in Parametric Test Using Adaptive and Parallel Test Concept”
Uwe Schiessl, Bernd Bischoff, Texas Instruments
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15:05
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“Adaptive Testing in Electronics Manufacturing Services – A Case Study”
Gunther Karner, Executive Director, optimiSE
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15:30
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Panel Discussion: “The Future of Adaptive Test: Where and How to Adapt?”
Panel chairman: Chris Portelli-Hale, STMicroelectronics
Panel introductory presentation: XATF – eXtendible Adaptive Test Format - A Next Generation Test Data Feedback Format as an Enabler for Adaptive Test
Stefan Eichenberger, DfX Technology Manager, Wafer Technology and Foundry Organization (WT&FO) / Operations, NXP Semiconductors
Panelists:
- Gunther Karner, OptiMise
- Debora Ahlgren, OptimalTest
- Roy Chorev, Teradyne
- Franz Ruckerbauer, Infineon
- Paul van Ulsen, Salland Engineering
- Stefan Eichenberger, NXP
- Tbd, STMicroelectronics
- Tbd, Kinesys Test Advantage
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Thursday 21 October 2010
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SESSION 2: Efficiency and Effectivity Improvements in Test Operations
Session-chair: Stefan Gasteiger, Advantest
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08:30
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“New Repeatability and Reproducibility Methodology for Semiconductor Testing”
Sergio Tenucci, FEM Europe EWS / Test Engineering R&D and Automation Director, STMicroelectronics, Marco Spinetta, FEM Europe EWS / Test Engineering R&D and Automation Advanced Testing Technologies Project Manager, STMicroelectronics
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08:55
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“High Speed Interface Testing - Implementing Low Cost Reusable Test Solution through DFT Using Versatile ATE”
Guillaume Meur, Product Engineer in the Imaging Division, STMicroelectronics
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09:20
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“Boosting Test Execution by Turning Parametrical Into Functional Tests”
Gert Haensel, Texas Instruments
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09:45
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Coffee Break
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SESSION 3: Enabling Development Advancement
Session-chair: Klaus-Detlef Paesch, GlobalFoundries
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10:15
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“Automated Failure Analysis Flow on BIST supported Memory Devices”
Emanuele Vazzoler, NVM Test Engineering Manager, STMicroelectronics Automotive Group (7 co-authors from STMicroelectronics, Politecnico di Torino and NplusT)
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10.40
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“IC Yield, Reliability and Prognostics Using Nanoscale Test Structures”
Hans Manhaeve, CEO, Q-Star Test
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11:05
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“The Test Program Factory – Automatic Generation of Platform Independent Test Programs”
David Codish, Product Engineering Manager, Numonyx
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11:30
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Panel Discussion: “Can we make our business more efficient by focusing, outsourcing and sharing key resources?”
Panel chairman: Rene Segers
Panel introductory presentation: “Labless Model Accelerated Adoption In Europe”
Michel Villemain, CEO, Presto Engineering
Panelists:
- Bertrand Flietner, Infineon
- Debora Ahlgren, OptimalTest
- Dirk de Vries, Qualtera
- Jon Lanson, Proveho Advisors
- Ivor Evans, CSR
- Michel Villemain, Presto
- Tbd, STMicroelectronics
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12:50
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Closing Remarks, Chris Portelli-Hale, STMicroelectronics
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Price Information
(19% VAT not included)
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Until
October 1
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After
October 1
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Onsite
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SEMI Members
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€ 225
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€ 275
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€ 325
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Non-Members
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€ 275
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€ 325
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€ 325
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Sponsorship – Industry Sponsors Wanted!
SEMICON Europa offers corporate sponsorship packages for the 12th European Manufacturing Test Conference (EMTC). If your company is interested, please review the Sponsorship Package or contact Beat Mueller, Director Member Relations at bmueller@semi.org Tel: +41 794656588.
SEMI Europe EMTC Committee members
M. Goldbach, LTX
M. Stadler, Teradyne
U. Schoettmer, Verigy
S. Eichenberger, NXP
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S.Gasteiger, Advantest
R. Barth, Numonyx
R. Segers
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K-D. Paesch, GlobalFoundries
C. Portelli, STMicroelectronics
D. Appello, STMicroelectronics
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