14th European Manufacturing Test Conference (EMTC)Overcoming New Test Challenges through Cooperation and InnovationDate: 10-11 October, 2012 Time: 14:00-17:30/08:00-12:30 Location: Messe Dresden
Continuing in its tradition of providing a practical focus on real solutions in the production test environment, SEMI (Semiconductor Equipment and Materials International) invites Test professionals to submit abstracts for the European Manufacturing Test Conference which will be held in conjunction with SEMICON Europe 10-11October 2012 in Dresden, Germany. At the EMTC 2012 we focus on papers that describe practical and successful solutions to challenges as well as success stories from the manufacturing test arena. |
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* sponsored by
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AGENDA | |
Wednesday 10 October | |
14:00 | Title TBD |
| Keynote: Bob Madge, GlobalFoundries |
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Session 1 | |
| 15:30-16:00 | Coffee Break |
Session 2 | |
| PANEL DISCUSSION: “Bridging the gap between the design and production” | |
Thursday, 11 October | |
Session 3 | |
| 09:50-10:30 | Coffee Break |
| 10:30-11:00 | ELEVATOR PITCH |
| 11:00-12:00 | PANEL DISCUSSION: “Innovation&Cooperation in Europe” |
* Become a Sponsor, view Sponsorship Opportunities online | |
Who should attend?
The EMTC focuses on (Design for) Test Technologies, Approaches and Equipment that are being developed in Europe and elsewhere. Attendance for this conference is a must for Product- and Test Engineers, as well as for their managers. As the conference also discusses breakthrough methodologies which impacts Test Operations, also test-fab managers and decision makers should attend and participate in the EMTC. Besides attending the formal sessions there are many opportunities to get together and discuss in an informal atmosphere the latest developments and experiences.
| S. Gasteiger, Advantest | M. Stadler, Teradyne | D. Appello, STMicroelectronics |
| K-D. Paesch, Globalfoundries | U. Schoettmer, Verigy | |
| P. Galletta, Micron | M. Stahl, Verigy | |
| P. Cockburn, Ltxc | R. Segers, ReSeCo | |
| P. Vanulsen, Salland | S. Eichenberger, NXP | |
| C. Portelli, STMicroelectronics | C. Caldeira, Nanium |




