15th European Manufacturing Test Conference (EMTC)

Semiconductor Test: A Reactive or Proactive Industry?

Date: 8 - 9 October 2013

Time: 13:00 - 18:00 / 09:00 - 12:30

Location: Garden Hall, Messe Dresden

 

This year's European Manufacturing Test Conference will focus on real solutions in the production test of semiconductor devices, but also invites discussion on MEMS and SiP testing and the challenges presented by "More than Moore" technologies.

Informed by presentations from key industry speakers, a panel discussion will debate "Is Test Becoming a Commodity?" and take a critical look at whether the test industry in Europe is a leader or follower of other semiconductor market segments.

Smaller, specialized solution companies will have the opportunity to present ideas and gather feedback from other industry experts and peers, helping to establish tighter links between start-ups, academic institutions and industry players involved in driving test to the next level.

 

 

 

 

Media Partner:

 

 

AGENDA

 Tuesday, 8 October

 

 

13:00

Opening

 

Chris Portelli-Hale, Director, STMicroelectronics

Session 1:

Next Steps in Cost of Test Reduction

Chairman:

Klaus-Detlef Paesch, Senior Manager Test Engineering, GLOBALFOUNDRIES

 

 

13:05

Keynote:

 

Last Stop Before Invoicing … No Pressure, Just Ship!

 

Malcolm Penn, CEO, Future Horizons

 

 

13:35

Automotive Single Insertion Multi-temperature KGD test solution

 

Gary Fleeman, Vice President, Marketing, Advantest

 

 

14:00

Cost-Effective Inertial MEMS Production Test Methods

 

John Ritchie, Manufacturing Consultant, SiTest Solutions

 

 

14:25

 

ATE Instrumentation Composite Architecture Advances Performance & Provides "IP" for Analog Mixed Signal Test"

 

Richard Liggiero, Chief Engineer, LTX-Credence

 

 

14:50

Coffee Break

Session 2:

New Test Challenges

Chairman:Rene Segers, Business Consultant, ReSeCo
15:10

An Introduction to CloudTestingTm

Making chip test available for everyone

Manabu Kimura, President, Cloud Testing Services
 
15:35Test Challenges Driven by the ITRS Roadmap
Roger Barth, Principal Engineer, Micron
16:00Coffee Break
16:30

Panel Discussion:

Is Test Becoming A Commodity?

Moderator:
Rene Segers, Business Consultant, ReSeCo

- Roger Barth, Principal Engineer, Micron

- Roberto Grandi, GM, Aptasic
- Arno Rudolph, Sales & Marketing Manager, RoodMicrotec
- Ken Lanier, Management Team, Teradyne
- Michael Stichlmair, Senior Vice President, Chief Marketing Officer, Advantest
- Helmut Tietzen, Director, Smartest
- Paul van Ulsen, Chief Executive Officer and President, Salland
- Steve Wigley, VP Marketing, LTX-Credence

 
18:00Closing Remarks
Rene Segers, Business Consultant, ReSeCo
 

 Wednesday, 9 October

   

Session 3:

Test Development and Industrialization Efficiency in Europe

Chairman:Peter Cockburn, Business Development Specialist, LTXC
09:00Keynote:
The technology and market forces shaping the future of the test
Risto Puhakka, President, VLSIresearch
 
09:30Quantified Contribution of Design for Manufacturing to Yield at 28nm
Thomas Herrmann, MTS Manufacturing Engineer, GLOBALFOUNDRIES
 

09:55

 

Methods and results of electrical testing and characterization of 3D specific devices fabricated on 300mm leading edge industry tools
Stephan Dobritz, Scientific Officer, Fraunhofer Institute
 
10:30Coffee Break

11:00

 

Panel Discussion:

How do we leverage EU leadership in MEMS test into other areas?

Moderator:
Peter Cockburn, Business Development Specialist, LTXC

- Chris Portelli-Hale, Director - EWS Operational Programs, STMicroelectronics

- Julien Arcamone, MEMS Business Development Manager, CEA Leti

- Reinhart Richter, CEO, Multitest

Adriano Mancosu, Business Development Manager, SOC Test Business Group,
  Advantest

 
12:30Closing Remarks
Rene Segers, Business Consultant, ReSeCo
 
12:35Lunch
 

 

Who should attend?

The EMTC focuses on (Design for) Test Technologies, Approaches and Equipment that are being developed in Europe and elsewhere. Attendance for this conference is a must for Product- and Test Engineers, as well as for their managers. As the conference also discusses breakthrough methodologies which impacts Test Operations, also test-fab managers and decision makers should attend and participate in the EMTC. Besides attending the formal sessions there are many opportunities to get together and discuss in an informal atmosphere the latest developments and experiences.

 

Price* Information and Registration

 
 Before 30. SeptemberAfter 01. OctoberOnsite
SEMI Members
315.-
365.-
415.-
Non-Members
365.-
415.-
415.-




* all Price information in EUR, VAT not included

  

Organizing Committee:

• Davide Appello, STMicroelectronics

• Peter Cockburn, ltxc

• Stefan Eichenberger, NXP

• José Felix, Nanium

• Piergiorgio Galletta, Micron

 

 

• Stefan Gasteiger, Advantest

• Klaus-Detlef Paesch, GlobalFoundries

• Chris Portelli-Hale (Co-chair), STMicroelectronics

• James Quinn, Multitest

• René Segers (Co-chair), ReSeCo

• Paul van Ulsen, Salland