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SEMICON Europa 2008 Information
10th European Manufacturing Test Conference (EMTC)
The EMTC 2008 will focus on topics that describe practical and successful solutions to current production testing challenges.
Tuesday 7 October 2008, 09:00-18:00
ICS- International Congress Centre Stuttgart, Germany
Conference Chair
Martin Stadler, Teradyne
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09.00-09.05
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Welcome by EMTC Conference Chair
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09.05-09.15
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Opening Remarks
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09.15-10:00
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Keynote: Test Implications of the ITRS Roadmap
Roger Barth, Numonyx
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Session I: "Package Test"
Session Chair: Klaus-Detlef Paesch, AMD
10.00-10.25
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Laser Direct Testing of IC Package Substrates
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Laurence Pujol, Beamind
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10.25-10.50
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Test Sockets – Addressing the Challenges of Leadfree Packages
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Gerhard Gschwendtberger, Multitest
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10.50-11.15
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Memory Test Sockets on the Move – from Spring Probes to PCR
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Joachim Moerbt, Advantest
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11.15-11.35
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Coffee break
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Session II: ”Adaptive Test”
Session Chair : René Segers, NXP Semiconductors
11.35-12.00
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Technology Innovations Enable Vastly Improved Test Quality
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Dan Glotter, Optimal Test
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12.00-12.25
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A Test Cell Control Architecture for Multiple External System Interfaces
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Steve Ledford, Verigy
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12.25-12.50
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Adaptive Test at NXP
Réne Segers, NXP Semiconductors
Dan Glotter, Optimal Test
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12.50-14.00
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Lunch
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Session III: “Test Engineering Challenges”
Session Chair: Martin Stadler, Teradyne
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14.00-14.25
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Cost Of Test (COT) Improvement – How to Keep Pace with the Current Test Challenges
Muriel Galtier, STMicroelectronics
Etienne Bossart, STMicroelectronics
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14.25-14.50
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TPG (Test Program Generator) – Generating a Full Test Program for a New Device in 1 Hour
Christian Bonnin, ATMEL Rousset
Pascal Coyault, LTX-Credence
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14.50-15.15
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Parallel RF Wafer Sort Production Testing
Martin Dresler, Verigy
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15.15-15.45
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Coffee Break
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15.45-16.10
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New Methods for Probe Card Monitoring and Evaluation
Darren James, Rudolph PCTA Division
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16.10-17:00
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Panel discussion: How Are We Doing on the Cost of Test?
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17.00-17.15
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Moderator: René Segers, NXP Semiconductors
Closing Remarks
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18.00-19.30
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SEMICON Europa International Reception
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Who should attend
Manufacturing test floor managers, experts, R&D counterparts and the key representatives of test equipment and service companies.
Price
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Valid through 26 September
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Beginning 27 September
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SEMI-Members
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€300
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€500
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Non-Members
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€400
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€500
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Platinum Sponsors
 
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