Metrology SessionExhibitor Presentation
Date: 13 October Time: 13:00-14:00 Location: TechARENA 1, Messe Dresden |
Agenda
| Session-chair: | Markus Pfeffer, Scientist, Fraunhofer IISB |
| 13:00 | SEAL- a Joint European Project for Semiconductor Equipment Assessment Leveraging Innovation |
| Richard Oechsner, Deputy Head of Department, Fraunhofer IISB | |
| 13:15 | Multi Sensor Metrology for Wafer Measurement |
| Thomas Fries, Managing Director, FRT | |
| 13:30 | |
| 13:45 | |
Who should attend?
European FAB management, related executives, and professionals from the semiconductor industry.
